Yield, variability, reliability, and stability of two-dimensional materials based solid-state electronic devices

Mario Lanza, Quentin Smets, Cedric Huyghebaert, Lain-Jong Li

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

The importance of statistical analyses on 2D materials-based electronic devices and circuits is sometimes overlooked. Here the authors discuss the most pressing integration issues for such devices and emphasize the need for yield, variability, reliability, and stability benchmarking, and outline viable strategies resulting in research papers that are useful for the industry.
Original languageEnglish (US)
JournalNature Communications
Volume11
Issue number1
DOIs
StatePublished - Nov 10 2020

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