X-ray stability and response of polymeric photodiodes for imaging applications

Panagiotis E. Keivanidis, Neil C. Greenham, Henning Sirringhaus, Richard H. Friend, James C. Blakesley, Robert Speller, Mariano Campoy-Quiles, Tiziano Agostinelli, Donal D.C. Bradley, Jenny Nelson

Research output: Contribution to journalArticlepeer-review

60 Scopus citations

Abstract

The x-ray stability of photodiodes made of poly(9,9-di- n -octylfluorene-co-benzothiadiazole):perylene diimide, poly[2,7-(9,9-di- n -octylfluorene)-co-(1,4-phenylene-[(4-sec-butylphenyl)imino]-1,4-phenylene)]: perylene diimide and poly(3-hexylthiophene):([6,6]-phenylC61-butyric acid methyl ester) (P3HT:PCBM) blends has been examined up to lifetime doses equivalent to those used in medical x-ray digital imaging applications. Dark currents and external quantum efficiencies (EQEs) are not significantly affected after exposure to 500 Gy. Only in the case of P3HT:PCBM is a significant loss in EQE (17% of the initial value) observed. Possible reasons for the observed changes are proposed. When a scintillation layer is attached to the devices, a linear dependence of the photocurrent on the x-ray dose rate is observed for the three material systems. © 2008 American Institute of Physics.
Original languageEnglish (US)
JournalApplied Physics Letters
Volume92
Issue number2
DOIs
StatePublished - Jan 28 2008
Externally publishedYes

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