X-ray diffraction imaging of material microstructures

Laszlo Varga (Inventor), Bonbien Varga (Inventor), Victor M. Calo (Inventor)

Research output: Patent

Abstract

Various examples are provided for x-ray imaging of the microstructure of materials. In one example, a system for non-destructive material testing includes an x-ray source configured to generate a beam spot on a test item; a grid detector configured to receive x- rays diffracted from the test object; and a computing device configured to determine a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the test object. In another example, a method for determining a microstructure of a material includes illuminating a beam spot on the material with a beam of incident x-rays; detecting, with a grid detector, x-rays diffracted from the material; and determining, by a computing device, a microstructure image based at least in part upon a diffraction pattern of the x-rays diffracted from the material.
Original languageEnglish (US)
Patent numberWO 2016166704 A1
StatePublished - Oct 20 2016

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