Wavefront sensor and method of reconstructing distorted wavefronts

Congli Wang (Inventor), Xiong Dun (Inventor), Qiang Fu (Inventor), Wolfgang Heidrich (Inventor)

Research output: Patent

Abstract

A wavefront sensor includes a mask and a sensor utilized to capture a diffraction pattern generated by light incident to the mask. A reference image is captured in response to a plane wavefront incident on the mask, and another measurement image is captured in response to a distorted wavefront incident on the mask. The distorted wavefront is reconstructed based on differences between the reference image and the measurement image.
Original languageEnglish (US)
Patent numberWO2018083573A1
StatePublished - May 11 2018

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