Variability and reliability in ultra-scaled MOS devices: How should they be evaluated from nanoscale to circuit level?

M. Nafría, R. Rodríguez, M. Porti, J. Martín-Martínez, M. Lanza, X. Aymerich

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'Variability and reliability in ultra-scaled MOS devices: How should they be evaluated from nanoscale to circuit level?'. Together they form a unique fingerprint.

Engineering & Materials Science