Ultra-high resolution optical coherence tomography for encapsulation quality inspection

Jakub Czajkowski, Tapio E J Fabritius, Jacek P. Ulański, Tomasz Marszałek, Maciej Gazicki-Lipman, Andrzej Nosal, Rafal Śliz, Erkki Alarousu, Tuukka Prykäri, Risto Antero Myllylä̈, Ghassan E. Jabbour

Research output: Contribution to journalArticlepeer-review

17 Scopus citations

Abstract

We present the application of ultra-high resolution optical coherence tomography (UHR-OCT) in evaluation of thin, protective films used in printed electronics. Two types of sample were investigated: microscopy glass and organic field effect transistor (OFET) structure. Samples were coated with thin (1-3 μm) layer of parylene C polymer. Measurements were done using experimental UHR-OCT device based on a Kerr-lens mode locked Ti: sapphire femtosecond laser, photonic crystal fibre and modified, free-space Michelson interferometer. Submicron resolution offered by the UHR-OCT system applied in the study enables registration of both interfaces of the thin encapsulation layer. Complete, volumetric characterisation of protective layers is presented, demonstrating possibility to use OCT for encapsulation quality inspection. © Springer-Verlag 2011.
Original languageEnglish (US)
Pages (from-to)649-657
Number of pages9
JournalApplied Physics B
Volume105
Issue number3
DOIs
StatePublished - Aug 28 2011

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Physics and Astronomy (miscellaneous)

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