Two-probe electrical measurements in transmission electron microscopes-behavioral control of tungsten microwires

Pedro Da Costa, Xiaosheng Fang, Shiliang Wang, Yuehui He, Yoshio Bando, Masanori Mitome, Jin Zou, Han Huang, Dmitri Golberg

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Abstract

Tungsten microwires have been manipulated and electrically probed inside a transmission electron microscope. Using Au electrodes, the current-voltage characteristics of the W structures were extracted. These showed highly variable behaviors dependent on various factors, the most important of these being orientation and stiffness of the contact. Careful control of loading force and Au-W contact angle enabled a considerable degree of behavior tailoring from nonlinear to Ohmic responses.

Original languageEnglish (US)
Pages (from-to)93-100
Number of pages8
JournalMicroscopy Research and Technique
Volume72
Issue number2
DOIs
StatePublished - Feb 1 2009

Keywords

  • Electrical contacts
  • I-V
  • TEM
  • Tungsten

ASJC Scopus subject areas

  • Anatomy
  • Histology
  • Instrumentation
  • Medical Laboratory Technology

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