Time resolved in-situ diffuse x-ray scattering measurements of the surface morphology of homoepitaxial SrTiO3 films during pulsed laser deposition

John D. Ferguson, Arthur R. Woll, Gokhan Arikan, Darren S. Dale, Aram Amassian, Mark W. Tate, Joel D. Brock

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

Homoepitaxial SrTiO3 thin films were grown on SrTiO3 (001) using Pulsed Laser Deposition (PLD). The deposition process was monitored in-situ, via both x-ray reflectivity and surface diffuse x-ray scattering measurements in the G3 experimental station at the Cornell High Energy Synchrotron Source (CHESS). Using a CCD detector in 1D, or streak-camera, mode with approximately 0.3-second time resolution, data were collected during growths performed at two substrate temperatures: 695°C and 1000°C. While the specular reflectivity oscillations for the two growths are very similar, the diffuse scattering clearly shows a distinct change in the peak position. Using Atomic Force Microscopy (AFM), we illustrate how the peak position for the diffuse lobes of scattered intensity is directly related to the distribution of single unit cell high islands on the growing surface. Thus, the peak shift of the diffuse scattering indicates an order of magnitude change in the island density.

Original languageEnglish (US)
Title of host publicationFerroelectrics, Multiferroics, and Magnetoelectrics
Pages7-13
Number of pages7
Volume1034
StatePublished - 2008
Externally publishedYes
Event2007 MRS Fall Meeting - Boston, MA, United States
Duration: Nov 26 2007Nov 30 2007

Other

Other2007 MRS Fall Meeting
CountryUnited States
CityBoston, MA
Period11/26/0711/30/07

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanical Engineering
  • Mechanics of Materials

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