Thermal stability dependence on states for multi-state MRAM

Yuankai Zheng*, Jinjun Qiu, Kebin Li, Zaibing Guo, Yihong Wu

*Corresponding author for this work

    Research output: Contribution to journalConference articlepeer-review

    Abstract

    The thermal stability dependence on states for multi-state magnetic random access memory (MRAM) was examined. In order to investigate the thermal stability, samples with structure of Ta2nm/ NiFe2nm/ CoFe1nm/ NiFe2nm/ IrMn4nm/ Ta5nm were sputtered using the UHV sputtering system. The results showed that thermal stability was different for different annealing temperatures which means MRAM thermal stability was different for different heating currents.

    Original languageEnglish (US)
    JournalDigests of the Intermag Conference
    StatePublished - Oct 1 2003
    EventIntermag 2003: International Magnetics Conference - Boston, MA, United States
    Duration: Mar 28 2003Apr 3 2003

    ASJC Scopus subject areas

    • Electrical and Electronic Engineering

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