The mobility and decay kinetics of charge carriers in pulse-ionized microcrystalline PCBM powder

Matthijs P. De Haas*, John M. Warman, Thomas Anthopoulos, Dago M. De Leeuw

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

58 Scopus citations

Abstract

The mobility and decay kinetics of charge carriers produced by nanosecond pulsed ionization of a microcrystalline powder sample of phenyl-C61 -butyric acid methyl ester (PCBM) have been investigated by time-resolved microwave conductivity. The sum of the electron and hole trap-free mobilities within crystallites is between 0.04 and 0.3 cm2 V-1 s -1 at room temperature with an activation energy of 0.066 eV. The decay of the conductivity, which takes place over a timcscale of milliseconds at room temperature, is controlled mainly by charge-carrier trapping with an activation energy of 0.53 eV. An upper limit of 1 × 10-18 m3s-1 is estimated for the rate coefficient of charge recombination, which is more than four orders of magnitude lower than expected for diffusion-controlled recombination, indicating PCBM to be an "indirect bandgap" semiconductor.

Original languageEnglish (US)
Pages (from-to)2274-2280
Number of pages7
JournalAdvanced Functional Materials
Volume16
Issue number17
DOIs
StatePublished - Nov 3 2006

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

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