The effects of X-ray irradiation-induced damage on reliability in MOS structures

Shi ho Kim*, Ho jun Lee, Chul hi Han, Kwyro Lee, Sang soo Choi, Young jin Jeon, Enzo Di Fabrizio, Massimo Gentili

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

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Engineering & Materials Science

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