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The effect of interfacial roughness on the thin film morphology and charge transport of high-performance polythiophenes
Youngsuk Jung*, R. Joseph Kline, Daniel A. Fischer, R. Joseph Kline, Martin Heeney, Iain Mcculloch, Dean M. DeLongchamp
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
106
Scopus
citations