Strain of MFI crystals in membranes: An in situ synchrotron X-ray study

Hae Kwon Jeong, Zhiping Lai, Michael Tsapatsis*, Jonathan C. Hanson

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

35 Scopus citations

Abstract

Temperature-resolved in situ synchrotron X-ray diffraction is used for the first time to study the microstructure evolution of a preferentially oriented zeolite membrane (siliceous ZSM-5) during calcination of the organic structure directing agent (tetrapropyl ammonium, TPA). Use of transmission sample geometry allowed us to discriminate in-plane from out-of-plane reflections and to calculate strain imposed on the zeolite layer along the in-plane (parallel to the support) as well as the out-of-plane (perpendicular to the support) direction over the entire calcination process. The results strongly suggest that the zeolite crystals of the membrane are under compressive in-plane stress and that their thermal behavior is quite different from free standing powder.

Original languageEnglish (US)
Pages (from-to)332-337
Number of pages6
JournalMicroporous and Mesoporous Materials
Volume84
Issue number1-3
DOIs
StatePublished - Sep 15 2005

Keywords

  • Crack formation
  • MFI zeolite membrane
  • Negative thermal expansion
  • Thermal behavior
  • Thin film stress

ASJC Scopus subject areas

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials

Fingerprint Dive into the research topics of 'Strain of MFI crystals in membranes: An in situ synchrotron X-ray study'. Together they form a unique fingerprint.

Cite this