Soft x-ray submicron imaging detector based on point defects in LiF

G. Baldacchini, S. Bollanti, F. Bonfigli, F. Flora*, P. Di Lazzaro, A. Lai, T. Marolo, R. M. Montereali, D. Murra, A. Faenov, T. Pikuz, E. Nichelatti, G. Tomassetti, A. Reale, L. Reale, A. Ritucci, Tania Limongi, L. Palladino, M. Francucci, S. MartellucciG. Petrocelli

*Corresponding author for this work

Research output: Contribution to journalReview articlepeer-review

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