Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale

Naresh Kumar, Alina Zoladek-Lemanczyk, Anne A. Y. Guilbert, Weitao Su, Sachetan M. Tuladhar, Thomas Kirchartz, Bob C. Schroeder, Iain McCulloch, Jenny Nelson, Debdulal Roy, Fernando A. Castro

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

Novel optoelectronic devices rely on complex nanomaterial systems where the nanoscale morphology and local chemical composition are critical to performance. However, the lack of analytical techniques that can directly probe these structure-property relationships at the nanoscale presents a major obstacle to device development. In this work, we present a novel method for non-destructive, simultaneous mapping of the morphology, chemical composition and photoelectrical properties with
Original languageEnglish (US)
Pages (from-to)2723-2731
Number of pages9
JournalNanoscale
Volume9
Issue number8
DOIs
StatePublished - 2017

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01
Acknowledgements: The authors acknowledge funding from the Technology Strategy Board (TSB) SCALLOPS project, UK. NK, AZL, DR, and FAC acknowledge funding from the UK Department of Business Innovation and Skills, through the National Measurement System. JN acknowledges the support of the Engineering and Physical Sciences Research Council via grants EP/K030671/1, EP/K029843/1 and the Supersolar Energy Hub (EP/J017361/1), and The Royal Society via a Wolfson Merit Award.

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