Si monolithic antenna calibration and de-embedding considerations

Atif Shamim, Langis Roy, Neric Fong, Gary Tarr, Vlad Levenets

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

This paper presents the design and implementation of an integrated balun for testing 24 GHz on-chip differential antennas. The balun is completely characterized on lossy Si substrate for subsequent de-embedding of the antenna impedance. A simple de-embedding technique is developed and verified to extract differential antenna impedance from single-ended S-parameters. The gain of the on-chip antennas is estimated through a novel gain calibration technique.

Original languageEnglish (US)
Title of host publicationAntem/URSI 2004 - 10th International Symposium on Antenna Technology and Applied Electromagnetics and URSI Conference, Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9780969256397
DOIs
StatePublished - 2004
Externally publishedYes
Event10th International Symposium on Antenna Technology and Applied Electromagnetics and URSI Conference, Antem/URSI 2004 - Ottawa, Canada
Duration: Jul 20 2004Jul 23 2004

Other

Other10th International Symposium on Antenna Technology and Applied Electromagnetics and URSI Conference, Antem/URSI 2004
CountryCanada
CityOttawa
Period07/20/0407/23/04

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Communication
  • Computer Networks and Communications

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