Sensitivity to molecular order of the electrical conductivity in oligothiophene monolayer films

Florent Martin, Bas L.M. Hendriksen, Allard J. Katan, Yabing Qi, Clayton Mauldin, Jean Frechet, Miquel Salmeron*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

Using conducting probe atomic force microscopy (CAFM), we show that electrical conductivity in oligothiophene molecular films deposited on SiO 2/Si wafers is extremely sensitive to degree of crystalline order in the film. By locally distorting the molecular order in the films through the controlled application of pressure with the AFM tip, the lateral charge transport was reduced by factors varying from 2 to 10, even when no changes in the height of the film could be observed.

Original languageEnglish (US)
Pages (from-to)1206-1210
Number of pages5
JournalLangmuir
Volume29
Issue number4
DOIs
StatePublished - Jan 29 2013

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Spectroscopy
  • Electrochemistry

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