Scattered surface charge density: A tool for surface characterization

Borislav Naydenov, Mauro Mantega, Ivan Rungger, Stefano Sanvito, John J. Boland

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

We demonstrate the use of nonlocal scanning tunneling spectroscopic measurements to characterize the local structure of adspecies in their states where they are significantly less perturbed by the probe, which is accomplished by mapping the amplitude and phase of the scattered surface charge density. As an example, we study single-H-atom adsorption on the n-type Si(100)-(4 × 2) surface, and demonstrate the existence of two different configurations that are distinguishable using the nonlocal approach and successfully corroborated by density functional theory. © 2011 American Physical Society.
Original languageEnglish (US)
JournalPhysical Review B
Volume84
Issue number19
DOIs
StatePublished - Nov 28 2011
Externally publishedYes

Fingerprint Dive into the research topics of 'Scattered surface charge density: A tool for surface characterization'. Together they form a unique fingerprint.

Cite this