Scanning Probe Microscopy: A Useful Tool for the Analysis of Carbon Black-Filled Polymer Blends

Ph Leclère*, R. Lazzaroni, R. Lazzaroni, F. Gubbels, M. De Vos, R. Deltour, R. Jérôme, Jean-Luc Bredas

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Conducting polymer composites, that consist of a conducting filler randomly distributed throughout insulating polymers or polymeric materials, deserve interest for different applications such as sensors and electromagnetic radiation shielding. The electrical resistivity of Carbon Black (CB)-filled multiphase polymer blends depends on the CB localization. This study has emphasized that Lateral Force Microscopy is a powerful tool to investigate the morphology of CB-filled polymer blends in relation to the blend composition and CB loading. As a rule, CB can be selectively localized in one phase or at the interface of a binary polymer blend, depending on the thermodynamics of the ternary system and the kinetics of the dispersion process. The selective localization of CB at the interface of polyblends with a co-continuous two-phase morphology is a unique situation that allows the CB percolation threshold to be decreased down to 0.5 wt%.

Original languageEnglish (US)
Pages (from-to)129-140
Number of pages12
JournalACS Symposium Series
Volume694
StatePublished - Dec 1 1998

ASJC Scopus subject areas

  • Chemistry(all)
  • Chemical Engineering(all)

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