Scanning force microscopy study of block copolymers containing a conjugated segment

Ph Leclere*, R. Lazzaroni, V. Parente, B. Francois, J. L. Bredas

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Atomic Force Microscopy (AFM) and related techniques are used to investigate the morphology of diblock copolymers. We focus on compounds containing a conjugated segment, polyparaphenylene, associated to a polymethylmethacrylate or a polystyrene block. The influence of the presence of the conjugated segment on the microdomain morphology is analyzed as a function of chain composition. Separate microdomains are observed on the surface of thin films by means of phase-detection imaging tapping-mode AFM. Their shape and size are interpreted in terms of molecular aggregation, with the help of molecular dynamics calculations.

Original languageEnglish (US)
Pages (from-to)395-400
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
Volume488
StatePublished - 1997
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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