Roughness effects on thermal-infrared emissivities estimated from remotely sensed images

Amit Mushkin*, Iryna Danilina, Alan R. Gillespie, Lee K. Balick, Matthew McCabe

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Multispectral thermal-infrared images from the Mauna Loa caldera in Hawaii, USA are examined to study the effects of surface roughness on remotely retrieved emissivities. We find up to a 3% decrease in spectral contrast in ASTER (Advanced Spaceborne Thermal Emission and Reflection Radiometer) 90-m/pixel emissivities due to sub-pixel surface roughness variations on the caldera floor. A similar decrease in spectral contrast of emissivities extracted from MASTER (MODIS/ASTER Airborne Simulator) ~12.5-m/pixel data can be described as a function of increasing surface roughness, which was measured remotely from ASTER 15-m/pixel stereo images. The ratio between ASTER stereo images provides a measure of sub-pixel surface-roughness variations across the scene. These independent roughness estimates complement a radiosity model designed to quantify the unresolved effects of multiple scattering and differential solar heating due to sub-pixel roughness elements and to compensate for both sub-pixel temperature dispersion and cavity radiation on TIR measurements.

Original languageEnglish (US)
Title of host publicationRemote Sensing for Environmental Monitoring, GIS Applications, and Geology VII
DOIs
StatePublished - Dec 1 2007
EventRemote Sensing for Environmental Monitoring, GIS Applications, and Geology VII - Florence, Italy
Duration: Sep 17 2007Sep 20 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6749
ISSN (Print)0277-786X

Other

OtherRemote Sensing for Environmental Monitoring, GIS Applications, and Geology VII
CountryItaly
CityFlorence
Period09/17/0709/20/07

Keywords

  • Emissivity
  • Surface roughness
  • Thermal infrared

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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