Reliability characteristics of metal/high-k PMOS with top interface engineered Band Offset Dielectric (BOD)

H. Rusty Harris*, Siddarth Krishnan, Huang Chun Wen, Husam Niman Alshareef, Aarthi Rao, Louis Solis, Prashant Majhi, Rino Choi, Byoung Hun Lee, Gennadi Bersuker, George A. Brown

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations
Original languageEnglish (US)
Title of host publication2006 IEEE International Reliability Physics Symposium Proceedings, 44th Annual
Pages661-662
Number of pages2
DOIs
StatePublished - Dec 1 2006
Event44th Annual IEEE International Reliability Physics Symposium, IRPS 2006 - San Jose, CA, United States
Duration: Mar 26 2006Mar 30 2006

Publication series

NameIEEE International Reliability Physics Symposium Proceedings
ISSN (Print)1541-7026

Other

Other44th Annual IEEE International Reliability Physics Symposium, IRPS 2006
CountryUnited States
CitySan Jose, CA
Period03/26/0603/30/06

ASJC Scopus subject areas

  • Engineering(all)

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