Reconstructed stacking faults in cobalt-doped hexagonal LuFeO3 revealed by mapping of cation distribution at the atomic scale

Andrew R. Akbashev*, Vladimir V. Roddatis, Alexander L. Vasiliev, Sergei Lopatin, Anna S. Semisalova, Nikolai S. Perov, Vadim A. Amelichev, Andrey R. Kaul

*Corresponding author for this work

    Research output: Contribution to journalArticlepeer-review

    9 Scopus citations

    Abstract

    The structure of an epitaxial thin film of cobalt-doped hexagonal LuFeO3 was studied by aberration-corrected high-resolution scanning transmission electron microscopy. The distribution maps of the chemical elements in the film were obtained using atomically resolved energy-dispersive X-ray spectroscopy. The study showed that cobalt ions have a strong tendency towards forming double layers of (Fe/Co)O2.5 between the Lu-O layers in a hexagonal structure. A significantly smaller amount of cobalt is found in single layers of FeO1.5, suggesting the presence of a trigonal-bipyramidal coordination of cobalt. The hexagonal LuFeO3 structure contains numerous reconstructed stacking faults that represent intergrown structural fragments of LuFe2-xCoxO4. Magnetization measurements revealed a decrease in the magnetic transition temperature of the LuFe0.7Co0.3O3 thin film compared to those of the parent hexagonal LuFeO3 and LuFe2-xCo xO4 forms.

    Original languageEnglish (US)
    Pages (from-to)5373-5376
    Number of pages4
    JournalCrystEngComm
    Volume14
    Issue number17
    DOIs
    StatePublished - Sep 7 2012

    ASJC Scopus subject areas

    • Chemistry(all)
    • Materials Science(all)
    • Condensed Matter Physics

    Fingerprint

    Dive into the research topics of 'Reconstructed stacking faults in cobalt-doped hexagonal LuFeO<sub>3</sub> revealed by mapping of cation distribution at the atomic scale'. Together they form a unique fingerprint.

    Cite this