Real-time dual-wavelength digital holographic microscopy with a single hologram

Jonas Kühn*, Tristan Colomb, Frédéric Montfort, Florian Charrière, Christian Depeursinge

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

We report on a method to achieve real-time dual-wavelength digital holographic microscopy with a single hologram acquisition. By recording both interferograms from two laser sources at different wavelengths in only one spatially-multiplexed digital hologram, we are able to independently propagate and apply numerical corrections on both wavefronts in order to obtain a beat-wavelength phase map of the specimen. This beat-wavelength being up to 10-100 times larger than the original wavelengths, we are in a situation where the 2π phase ambiguity of conventional DHM is removed and the phase measurement range of the technique is extended up to several tens of microns in height. The unique capability to perform such an operation with a single acquisition unables real-time dual-wavelength DHM measurements. Results on a moving micro-mirror are presented in this paper. We think that such a real-time dual-wavelength method represents a strong improvement to the current DHM state-of-the-art, and that it opens a whole new field of applications for this technique.

Original languageEnglish (US)
Title of host publicationOptical Measurement Systems for Industrial Inspection V
Volume6616
EditionPART 1
DOIs
StatePublished - 2007
Externally publishedYes
EventOptical Measurement Systems for Industrial Inspection V - Munich, Germany
Duration: Jun 18 2007Jun 22 2007

Other

OtherOptical Measurement Systems for Industrial Inspection V
CountryGermany
CityMunich
Period06/18/0706/22/07

Keywords

  • Beat-wavelength
  • Digital holography
  • Dual-wavelength
  • Microscopy
  • Two-wavelengths

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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