Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution

Jonas Kühn*, Tristan Colomb, Christophe Pache, Florian Charrière, Frédéric Montfort, Etienne Cuche, Yves Emery, Pierre Marquet, Christian Depeursinge

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

6 Scopus citations


We report on advanced dual-wavelength digital holographic microscopy (DHM) methods, enabling single-acquisition real-time micron-range measurements while maintaining single-wavelength interferometric resolution in the nanometer regime. In top of the unique real-time capability of our technique, it is shown that axial resolution can be further increased compared to single-wavelength operation thanks to the uncorrelated nature of both recorded wavefronts. It is experimentally demonstrated that DHM topographic investigation within 3 decades measurement range can be achieved with our arrangement, opening new applications possibilities for this interferometric technique.

Original languageEnglish (US)
Title of host publicationThree-Dimensional and Multidimensional Microscopy
Subtitle of host publicationImage Acquisition and Processing XV
StatePublished - 2008
Externally publishedYes
EventThree-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV - San Jose, CA, United States
Duration: Jan 21 2008Jan 24 2008


OtherThree-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV
CountryUnited States
CitySan Jose, CA


  • Beat-wavelength
  • Digital holography
  • Dual-wavelength
  • Phase microscopy
  • Two-wavelengths

ASJC Scopus subject areas

  • Engineering(all)

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