Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy

Riya Bose, Jingya Sun, Jafar Iqbal Khan, Basamat S. Shaheen, Aniruddha Adhikari, Tien Khee Ng, Victor M. Burlakov, Manas R. Parida, Davide Priante, Alain Goriely, Boon S. Ooi, Osman Bakr, Omar F. Mohammed

Research output: Contribution to journalArticlepeer-review

18 Scopus citations

Abstract

A breakthrough in the development of 4D scanning ultrafast electron microscopy is described for real-time and space imaging of secondary electron energy loss and carrier diffusion on the surface of an array of nanowires as a model system, providing access to a territory that is beyond the reach of either static electron imaging or any time-resolved laser spectroscopy.
Original languageEnglish (US)
Pages (from-to)5106-5111
Number of pages6
JournalAdvanced Materials
Volume28
Issue number25
DOIs
StatePublished - Apr 25 2016

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