Point sampling with uniformly distributed lines

J. Rovira*, Peter Wonka, F. Castro, M. Sbert

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

12 Scopus citations

Abstract

In this paper we address the problem of extracting representative point samples from polygonal models. The goal of such a sampling algorithm is to find points that are evenly distributed. We propose star-discrepancy as a measure for sampling quality and propose new sampling methods based on global line distributions. We investigate several line generation algorithms including an efficient hardware-based sampling method. Our method contributes to the area of point-based graphics by extracting points that are more evenly distributed than by sampling with current algorithms.

Original languageEnglish (US)
Title of host publicationPoint-Based Graphics, 2005 - Eurographics/IEEE VGTC Symposium Proceedings
Pages109-118
Number of pages10
StatePublished - Dec 1 2005
EventEurographics/IEEE VGTC Symposium on Point-Based Graphics, 2005 - Stony Brook, NY, United States
Duration: Jun 20 2005Jun 21 2005

Publication series

NamePoint-Based Graphics, 2005 - Eurographics/IEEE VGTC Symposium Proceedings

Other

OtherEurographics/IEEE VGTC Symposium on Point-Based Graphics, 2005
CountryUnited States
CityStony Brook, NY
Period06/20/0506/21/05

ASJC Scopus subject areas

  • Engineering(all)

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