Parasitic absorption in the rear reflector of a silicon solar cell: Simulation and measurement of the sub-bandgap reflectance for common dielectric/metal reflectors

Zachary C. Holman*, Miha Filipič, Benjamin Lipovšek, Stefaan De Wolf, Franc Smole, Marko Topič, Christophe Ballif

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

56 Scopus citations

Abstract

The rear side of a silicon solar cell is often designed to minimize surface recombination, series resistance, and cost, but not necessarily parasitic absorption. We present a comprehensive study of parasitic absorption in the metal layer of solar cells with dielectric/metal rear reflectors. The sub-bandgap reflectance of a solar cell or test structure is proposed as an experimentally accessible probe of parasitic absorption, and it is correlated with short-circuit current density. The influence of surface texture, dielectric refractive index and thickness, and metal refractive index on sub-bandgap reflectance - and thus current - is then both calculated and measured. From the results, we formulate design rules that promote optimum infrared response in a wide variety of silicon solar cells.

Original languageEnglish (US)
Pages (from-to)426-430
Number of pages5
JournalSolar Energy Materials and Solar Cells
Volume120
Issue numberPART A
DOIs
StatePublished - Jan 1 2014

Keywords

  • Light trapping
  • PERL
  • Parasitic absorption
  • Rear reflector
  • Silicon
  • Solar cell

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Renewable Energy, Sustainability and the Environment
  • Surfaces, Coatings and Films

Fingerprint Dive into the research topics of 'Parasitic absorption in the rear reflector of a silicon solar cell: Simulation and measurement of the sub-bandgap reflectance for common dielectric/metal reflectors'. Together they form a unique fingerprint.

Cite this