Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry

Hsiang-Lin Liu, Chih-Chiang Shen, Sheng-Han Su, Chang-Lung Hsu, Ming-yang Li, Lain-Jong Li

Research output: Contribution to journalArticlepeer-review

229 Scopus citations

Abstract

Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical-vapor-deposited monolayer transition metal dichalcogenides (TMDs). The extraordinary large value of the refractive index in the visible frequency range is obtained. The absorption response shows a strong correlation between the magnitude of the exciton binding energy and band gap energy. Together with the observed giant spin-orbit splitting, these findings advance the fundamental understanding of their novel electronic structures and the development of monolayer TMDs-based optoelectronic and spintronic devices.
Original languageEnglish (US)
Pages (from-to)201905
JournalApplied Physics Letters
Volume105
Issue number20
DOIs
StatePublished - Nov 17 2014

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