On the Limits of Scalpel AFM for the 3D Electrical Characterization of Nanomaterials

Shaochuan Chen, Lanlan Jiang, Mark Buckwell, Xu Jing, Yanfeng Ji, Enric Grustan-Gutierrez, Fei Hui, Yuanyuan Shi, Mathias Rommel, Albena Paskaleva, Guenther Benstetter, Wing H. Ng, Adnan Mehonic, Anthony J. Kenyon, Mario Lanza

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Engineering & Materials Science