On the bit-error rate of binary phase shift keying over additive white generalized laplacian noise (AWGLN) channels

Ferkan Yilmaz, Mohamed-Slim Alouini

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

This paper considers a more general additive noise distribution, termed either as generalized Laplacian (GL) or McLeish distribution whose non-Gaussianity nature is parameterized to fit different impulsive noise environments, and analyzes the bit-error rate of binary phase shift keying modulation over additive white GL noise (AWGLN) channels in flat fading environments. Specifically, a closed-form expression is offered for the extended generalized-K fading environments, and accordingly, its simplifications for some special fading distributions and special additive noise models are presented. Finally, the mathematical formalism is illustrated by numerical examples, and verified by computer based simulations.
Original languageEnglish (US)
Title of host publication2018 26th Signal Processing and Communications Applications Conference (SIU)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages1-4
Number of pages4
ISBN (Print)9781538615010
DOIs
StatePublished - Jul 9 2018

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