Graphene electrodes are being massively introduced in a wide range of electronic devices. On the contrary, exhaustive ageing studies, which are necessary prior to device commercialization, have never been performed before. Here we present the first complete reliability study of a carbon-based electrode, and the main ageing mechanisms are discussed by means of accelerated tests, nanoscale and device level experiments, as well as Weibull statistical analyses and tunneling current simulations. Our results indicate that the formation of an ultra-thin oxide layer on pristine graphene and tall oxide hillocks at graphene point defects are the main two ageing mechanisms, and they differently affect the electron transfer in the graphene sheets.
|Original language||English (US)|
|Title of host publication||Proceedings of the 2015 10th Spanish Conference on Electron Devices, CDE 2015|
|Publisher||Institute of Electrical and Electronics Engineers Inc.|
|State||Published - Jan 1 2015|