On partial tests and partial reducts for decision tables

Mikhail Ju Moshkov*, Marcin Piliszczuk

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In the paper a greedy algorithm for construction of partial tests is considered. Bounds on minimal cardinality of partial reducts are obtained. Results of experiments with software implementation of the greedy algorithm are described.

Original languageEnglish (US)
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Pages149-155
Number of pages7
Volume6104
StatePublished - 2006
Externally publishedYes
EventHigh-Power Diode Laser Technology and Applications IV - San Jose, CA, United States
Duration: Jan 23 2006Jan 25 2006

Other

OtherHigh-Power Diode Laser Technology and Applications IV
CountryUnited States
CitySan Jose, CA
Period01/23/0601/25/06

Keywords

  • Greedy algorithm
  • Partial cover
  • Partial reduct
  • Partial test

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics

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