On-chip antenna measurements: Calibration and de-embedding considerations

Atif Shamim*, Langis Roy, Neric Fong, Gary Tarr, Vlad Levenets

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Abstract

This paper presents the design and implementation of an integrated balun for testing 24 GHz on-chip differential antennas. The balun is completely characterized on lossy Si substrate for subsequent de-embedding of the antenna impedance. A simple de-embedding technique is developed and verified to extract differential antenna impedance from single-ended S-parameters. The gain of the on-chip antennas is easily estimated through a novel gain calibration technique. Finally, near to far field transformation is employed to extract full radiation patterns.

Original languageEnglish (US)
Title of host publicationIMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference
Pages463-466
Number of pages4
Volume1
StatePublished - 2005
Externally publishedYes
EventIMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference - Ottawa, ON, Canada
Duration: May 16 2005May 19 2005

Other

OtherIMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference
CountryCanada
CityOttawa, ON
Period05/16/0505/19/05

Keywords

  • Balun
  • De-embedding
  • Gain measurement
  • On-chip antenna

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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