Nanoscale and device level analysis of the resistive switching phenomenon in ultra-thin high-k gate dielectrics

A. Crespo-Yepes, J. Martin-Martinez, V. Iglesias, R. Rodriguez, M. Porti, M. Nafria, X. Aymerich, M. Lanza

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint

Dive into the research topics of 'Nanoscale and device level analysis of the resistive switching phenomenon in ultra-thin high-k gate dielectrics'. Together they form a unique fingerprint.

Physics & Astronomy