Mode conversion and leaky-wave excitation at open-end coupled microstrip discontinuities

Joseph Cina, Lawrence Carin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

The method of moments (MoM) is used to study mode conversion and leaky-wave excitation at an asymmetric coupled-microstrip discontinuity. The results show that significant mode conversion can occur at such discontinuities and that fundamental leaky-wave modes can be excited strongly. Numerical issues with regard to the MoM analysis of such discontinuities are addressed as well, and it is shown that inclusion of a complete-domain basis function for the fundamental leaky mode improves numerical stability dramatically.
Original languageEnglish (US)
Title of host publicationIEEE MTT-S International Microwave Symposium Digest
PublisherIEEEPiscataway, NJ, United States
Pages225-228
Number of pages4
StatePublished - Jan 1 1995
Externally publishedYes

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