Microstructure of block copolymers containing a conjugated segment, as studied with atomic force microscopy

R. Lazzaroni*, Ph Leclere, A. Couturiaux, V. Parente, B. Francois, Jean-Luc Bredas

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

14 Scopus citations

Abstract

The microscopic morphology of thin films of block copolymers is investigated with Atomic Force Microscopy (AFM). The block copolymers consist of a conjugated polyparaphenylene segment associated to either a polystyrene or a polymethyl methacrylate thermoplastic sequence. Formation of phase-segregated microdomains is observed on the nanometer scale. The AFM images are interpreted in terms of molecular packing with the help of molecular dynamics calculations.

Original languageEnglish (US)
Pages (from-to)1279-1282
Number of pages4
JournalSynthetic Metals
Volume102
Issue number1-3
DOIs
StatePublished - Jan 1 1999
EventProceedings of the 1998 International Conference on Science and Technology of Synthetic Metals (ICSM-98) - Montpellier
Duration: Jul 12 1998Jul 18 1998

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

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