TY - GEN
T1 - Metallic nanoparticles in dielectrics: A comparative study
AU - Agambayev, Agamyrat
AU - Farhat, Mohamed
AU - Bagci, Hakan
AU - Salama, Khaled N.
N1 - KAUST Repository Item: Exported on 2020-04-23
Acknowledgements: The authors would like to thank the Saudi Basic Industries Corporation (SABIC) for partially funding this work under Grant No. RGC/3/2385-01.
PY - 2017/10/18
Y1 - 2017/10/18
N2 - The Maxwell-Garnett method is used to predict the effective dielectric constant and the tangent loss of various composites consisting of a PVDF-TrFE-CFE-matrix and metallic microsphere fillers made of Cu, Ni, W, Zn, or Fe. Simulation results demonstrate that for small filler fraction values and at low frequencies, the electrical properties of the resulting composite do not depend on the conductivity of the filler. These findings show that composites fabricated using cheaper metal nanoparticle fillers are as effective as those fabricated using expensive ones.
AB - The Maxwell-Garnett method is used to predict the effective dielectric constant and the tangent loss of various composites consisting of a PVDF-TrFE-CFE-matrix and metallic microsphere fillers made of Cu, Ni, W, Zn, or Fe. Simulation results demonstrate that for small filler fraction values and at low frequencies, the electrical properties of the resulting composite do not depend on the conductivity of the filler. These findings show that composites fabricated using cheaper metal nanoparticle fillers are as effective as those fabricated using expensive ones.
UR - http://hdl.handle.net/10754/626056
UR - http://ieeexplore.ieee.org/document/8072652/
UR - http://www.scopus.com/inward/record.url?scp=85042312227&partnerID=8YFLogxK
U2 - 10.1109/APUSNCURSINRSM.2017.8072652
DO - 10.1109/APUSNCURSINRSM.2017.8072652
M3 - Conference contribution
AN - SCOPUS:85042312227
SN - 9781538632840
SP - 1219
EP - 1220
BT - 2017 IEEE International Symposium on Antennas and Propagation & USNC/URSI National Radio Science Meeting
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -