Measuring shape and surfaces down to the nanometer and nanosecond scales by digital holographic microscopy

Christian Depeursinge, Isabelle Bergoënd, Nicolas Pavillon, Jonas Kühn, Tristan Colomb, Frédéric Montfort, Etienne Cuche, Yves Emery

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageEnglish (US)
Title of host publicationFringe 2009 - 6th International Workshop on Advanced Optical Metrology
PublisherSpringer-Verlag Berlin Heidelberg
Pages411-415
Number of pages5
ISBN (Print)9783642030505
DOIs
StatePublished - 2009
Externally publishedYes
Event6th International Workshop on Advanced Optical Metrology, Fringe 2009 - Stuttgart, Germany
Duration: Sep 1 2009Sep 1 2009

Other

Other6th International Workshop on Advanced Optical Metrology, Fringe 2009
CountryGermany
CityStuttgart
Period09/1/0909/1/09

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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