Measurement of the surface susceptibility and the surface conductivity of atomically thin MoS2 by spectroscopic ellipsometry

Gaurav Jayaswal, Zhenyu Dai, Xixiang Zhang, Mirko Bagnarol, Alessandro Martucci, Michele Merano

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Abstract

We show how to correctly extract from the ellipsometric data the surface susceptibility and the surface conductivity that describe the optical properties of monolayer $\rm MoS_2$. Theoretically, these parameters stem from modelling a single-layer two-dimensional crystal as a surface current, a truly two-dimensional model. Currently experimental practice is to consider this model equivalent to a homogeneous slab with an effective thickness given by the interlayer spacing of the exfoliating bulk material. We prove that the error in the evaluation of the surface susceptibility of monolayer $\rm MoS_2$, owing to the use of the slab model, is at least 10% or greater, a significant discrepancy in the determination of the optical properties of this material.
Original languageEnglish (US)
Pages (from-to)703
Number of pages1
JournalOptics Letters
Volume43
Issue number4
DOIs
StatePublished - Feb 7 2018

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