Material Classification Using Raw Time-of-Flight Measurements

Shuochen Su, Felix Heide, Robin J. Swanson, Jonathan Klein, Clara Callenberg, Matthias Hullin, Wolfgang Heidrich

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Scopus citations

Abstract

We propose a material classification method using raw time-of-flight (ToF) measurements. ToF cameras capture the correlation between a reference signal and the temporal response of material to incident illumination. Such measurements encode unique signatures of the material, i.e. the degree of subsurface scattering inside a volume. Subsequently, it offers an orthogonal domain of feature representation compared to conventional spatial and angular reflectance-based approaches. We demonstrate the effectiveness, robustness, and efficiency of our method through experiments and comparisons of real-world materials.
Original languageEnglish (US)
Title of host publication2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
ISBN (Print)9781467388511
DOIs
StatePublished - Dec 13 2016

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