We propose a material classification method using raw time-of-flight (ToF) measurements. ToF cameras capture the correlation between a reference signal and the temporal response of material to incident illumination. Such measurements encode unique signatures of the material, i.e. the degree of subsurface scattering inside a volume. Subsequently, it offers an orthogonal domain of feature representation compared to conventional spatial and angular reflectance-based approaches. We demonstrate the effectiveness, robustness, and efficiency of our method through experiments and comparisons of real-world materials.
|Original language||English (US)|
|Title of host publication||2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)|
|Publisher||Institute of Electrical and Electronics Engineers (IEEE)|
|State||Published - Dec 13 2016|