Mapping the local dielectric response at the nanoscale by means of plasmonic force spectroscopy

Francesco De Angelis*, Remo Proietti Zaccaria, Enzo Di Fabrizio

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

8 Scopus citations

Abstract

At the present, the local optical properties of nanostructured materials are difficult to be measured by available instrumentation. We investigated the capability of plasmonic force spectroscopy of measuring the optical response at the nanoscale. The proposed technique is based on force measurements performed by combining Atomic Force Microscopy, or optical tweezers, and adiabatic compression of surface plasmon polaritons. We show that the optical forces, caused by the plasmonic field, depend on the local response of the substrates and, in principle, allow probing both the real and the imaginary part of the local permittivity with a spatial resolution of few nanometers.

Original languageEnglish (US)
Pages (from-to)29626-29633
Number of pages8
JournalOptics Express
Volume20
Issue number28
DOIs
StatePublished - Dec 31 2012

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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