Magnetic order in a submicron patterned permalloy film studied by resonant x-ray scattering

Carlo Spezzani*, Mauro Fabrizioli, Patrizio Candeloro, Enzo Di Fabrizio, Giancarlo Panaccione, Maurizio Sacchil

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

We have used specular and off-specular x-ray scattering to follow the field dependent magnetization in an array of 1000 nm × 350 nm permalloy rectangles. Sensitivity to the magnetic properties of the permalloy was obtained by tuning the x-ray energy to the Fe 2p resonance. The corresponding wavelength matches the Bragg condition for the regular horizontal structure of the pattern. The magnetic behavior was found to depend on the orientation of the field with respect to the rectangles: we observed the presence of a strong magnetic anisotropy induced by the patterning, with a magnetic hard axis in the direction of the shorter side of the rectangles.

Original languageEnglish (US)
Article number224412
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume69
Issue number22
DOIs
StatePublished - Jun 1 2004

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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