Low temperature magnetization and resistivity measurements in Co based soft magnetic microwires

J. Llumá*, M. Vázquez, J. M. Hernandez, J. M. Ruiz, J. M. García-Beneytez, A. Zhukov, F. J. Castaño, X. X. Zhang, J. Tejada

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

8 Scopus citations

Abstract

Magnetization and resistivity measurements, embracing a temperature range 2-300 K, have been performed in glass-coated Co68Mn7Si10B15 amorphous microwires. The relation between both types of measurements is analyzed. Similar trends of the temperature dependence of the domain structure, magnetization and resistivity are observed. An increase of resistance is found for the saturated state. This increase of the resistivity is analyzed in terms of the domain structure and the presence of domain walls.

Original languageEnglish (US)
Pages (from-to)821-823
Number of pages3
JournalJournal of Magnetism and Magnetic Materials
Volume196
DOIs
StatePublished - May 1 1999
EventProceedings of the 1998 7th European Magnetic Materials and Applications Conference, EMMA-98 - Zaragoza, Spain
Duration: Sep 9 1998Sep 12 1998

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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