Low operation voltage transparent resistive random access memory (T-RRAM) based on ultrathin a-TiOx films and its resistive switching characteristics

Yi Jen Huang, I. Chung Shih, Shih Chun Chao, Cheng Yen Wen, Jr-Hau He, Si Chen Lee

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Engineering & Materials Science