Links between electrical and optical fatigue in Pb(Zr,Ti)O3 thin films

William L. Warren*, Duane Dimos, Husam Niman Alshareef, Mark V. Raymond, Bruce A. Tuttle, Gordon E. Pike

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

Switchable polarization can be significantly suppressed in ferroelectric (FE) materials by electrical or optical processes. Electrical suppression can occur by subjecting the FE to repeated polarization reversals; optical suppression can occur while biasing the FE near the switching threshold and illuminating with bandgap light. A link between the two processes in Pb(Zr,Ti)O3 (PZT) thin film capacitors is demonstrated by showing a relationship between the amount of the suppressed polarization induced by the two methods. This observation suggests that the optical method may be a useful, simple, and time-saving probe of a material's susceptibility to fatigue. These results further support the view that polarization suppression in PZT thin films induced by electrical fatigue largely involves electronic charge trapping.

Original languageEnglish (US)
Pages (from-to)1714-1716
Number of pages3
JournalJournal of the American Ceramic Society
Volume79
Issue number6
DOIs
StatePublished - Jan 1 1996

ASJC Scopus subject areas

  • Ceramics and Composites
  • Materials Chemistry

Fingerprint Dive into the research topics of 'Links between electrical and optical fatigue in Pb(Zr,Ti)O<sub>3</sub> thin films'. Together they form a unique fingerprint.

Cite this