Linear deflectometry - Regularization and experimental design [Lineare deflektometrie - Regularisierung und experimentelles design]

Jonathan Balzer, Stefan Werling, Jürgen Beyerer

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Specular surfaces can be measured with deflectometric methods. The solutions form a one-parameter family whose properties are discussed in this paper. We show in theory and experiment that the shape sensitivity of solutions decreases with growing distance from the optical center of the imaging component of the sensor system and propose a novel regularization strategy. Recommendations for the construction of a measurement setup aim for benefiting this strategy as well as the contrarian standard approach of regularization by specular stereo. © Oldenbourg Wissenschaftsverlag.
Original languageEnglish (US)
Pages (from-to)43-50
Number of pages8
Journaltm - Technisches Messen
Volume78
Issue number1
DOIs
StatePublished - Jan 2011

ASJC Scopus subject areas

  • Instrumentation
  • Electrical and Electronic Engineering

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