Investigation of radiation effects on the properties of organic semiconductors using low-dose TEM analysis

Dalaver Anjum, Rachid Sougrat, Z. Kui, Aram Amassian

Research output: Contribution to journalArticlepeer-review

Original languageEnglish (US)
Pages (from-to)1436-1437
Number of pages2
JournalMicroscopy and Microanalysis
Volume18
DOIs
StatePublished - Jan 1 2012

ASJC Scopus subject areas

  • Instrumentation

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