Inkjet-printed organic electronics: Operational stability and reliability issues

M. C.R. Medeiros, C. Martinez-Domingo, E. Ramon, A. T. Negrier, E. Sowade, K. Y. Mitra, R. R. Baumann, Iain Mcculloch, J. Carrabina, H. L. Gomes

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations

Abstract

The operational stability of all-inkjet printed transistors is reported. At room temperature the threshold voltage shifts following a stretched exponential with a relaxation time τ=1×103 s. Two distinct trap sites active in different temperature ranges, one at 200-250 K and other above 310 K cause the electrical instability. Both types of traps capture holes and can be fast neutralized by photogenerated electrons. Optically induced detrapping currents confirm the differences in trap signature. It is proposed, that the traps have a common physical origin related to water.

Original languageEnglish (US)
Title of host publicationOrganic Semiconductor Materials, Devices, and Processing 4
PublisherElectrochemical Society Inc.
Pages1-10
Number of pages10
Edition26
ISBN (Print)9781607684787
DOIs
StatePublished - Jan 1 2013
EventSymposium on Organic Semiconductor Materials, Devices, and Processing 4 - 223rd Meeting of the Electrochemical Society - Toronto, ON, Canada
Duration: May 12 2013May 16 2013

Publication series

NameECS Transactions
Number26
Volume53
ISSN (Print)1938-5862
ISSN (Electronic)1938-6737

Other

OtherSymposium on Organic Semiconductor Materials, Devices, and Processing 4 - 223rd Meeting of the Electrochemical Society
CountryCanada
CityToronto, ON
Period05/12/1305/16/13

ASJC Scopus subject areas

  • Engineering(all)

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