Infrared reflectivity of Cox(SiO2)1-x (x∼0.85, 0.55, 0.38) granular films on SiO2 glass substrates

Néstor E. Massa*, Juliano C. Denardin, Leandro M. Socolovsky, Marcelo Knobel, Fernando Pablo de la Cruz, Xixiang Zhang

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

We report the infrared specular reflectivity of Cox(SiO2)1-x (x ∼ 0.85, 0.55, 0.38) films on SiO2 glass spanning from a metal-like to insulating behavior. While films for x ∼ 0.85 show carrier metallic shielding and hopping conductivity, for x ∼ 0.65 and lower concentrations, the nanoparticles' number and size promote a localization edge near the highest longitudinal optical frequency. Such an edge is associated with a reflectivity minimum and a higher frequency band connoting strong electron-phonon interactions, carrier phonon assisted hopping, and polaron formation. Optical conductivity fits with current polaron models provide grounds toward a microscopic understanding of transport properties in these as-prepared granular films.

Original languageEnglish (US)
Pages (from-to)551-554
Number of pages4
JournalSolid State Communications
Volume141
Issue number10
DOIs
StatePublished - Mar 1 2007

Keywords

  • A. Granular films
  • D. Electron-phonon interactions
  • D. Optical properties
  • E. Light absorption and reflection

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

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